Demise of Just-in-Time Manufacturing Has Been Greatly Exaggerated
Frank Lavety General Manager, Kandou Close up of examining of test sample of microchip transistor under the microscope in laboratory. Equipment for testing Read More..
Via PUF Technology as a Root of Trust in IoT Supply Chain
A Study on PUF Technology as Silicon "InbornID" Paper Submitted by Teddy Kyung Lee, CTO, ICTK Root of Trust in IoT Supply Chain The Read More..